Anderson Electronics, LLC TEL: (814) 695-4428   FAX: (814) 696-0403   Email: sales@aextal.com
Anderson Electronics Flash navigation menu appears here. This site uses the free Macromedia Flash player.
PIND - Particle Impact Noise Detection

Extraneous solid material inside the crystal package can cause catastrophic failure of the resonator if it collides with the quartz plate, mount or plate to mount interface. The quartz plate can even be fractured by particle impact. The material may be bits of quartz, glass from the base, metal from the leads or holder, or solder balls.

The test to detect extraneous solid material is called PIND, Particle Impact Noise Detection. It is an acoustic test where the crystal is subjected to a mild shock while being acoustically monitored. The sound made by the particles as a result of the shock can be detected. If the PIND test detect particles inside the crystal the crystal is either scrapped or reworked to remove the particle.

(Go to top of page)


[Home] [Product Search] [Find a Representative] [Technical Information] [Contact Us] [About Us]

Copyright 2010 Anderson Electronics, LLC